"Pairwise Test Case Generation Based on Module Dependency."

Jangbok Kim, Kyunghee Choi, Gihyun Jung (2006)

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DOI: 10.1093/IETISY/E89-D.11.2811

access: closed

type: Journal Article

metadata version: 2020-04-11

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Jangbok Kim, Kyunghee Choi, Gihyun Jung:
Pairwise Test Case Generation Based on Module Dependency. IEICE Trans. Inf. Syst. 89-D(11): 2811-2813 (2006)

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