"Embedding of Ti Nanodots into SiOx and Its Impact on Resistance ..."

Yusuke Kato et al. (2017)

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DOI: 10.1587/TRANSELE.E100.C.468

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/KatoOIMM17
Yusuke Kato, Akio Ohta, Mitsuhisa Ikeda, Katsunori Makihara, Seiichi Miyazaki:
Embedding of Ti Nanodots into SiO_x and Its Impact on Resistance Switching Behaviors. IEICE Trans. Electron. 100-C(5): 468-474 (2017)

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