"Delay Defect Diagnosis Methodology Using Path Delay Measurements."

Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham (2015)

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DOI: 10.1587/TRANSELE.E98.C.991

access: closed

type: Journal Article

metadata version: 2020-04-11

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Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham:
Delay Defect Diagnosis Methodology Using Path Delay Measurements. IEICE Trans. Electron. 98-C(10): 991-994 (2015)

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