"Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded ..."

Takashi Ito et al. (2010)

> Home

Details and statistics

DOI: 10.1587/TRANSELE.E93.C.1638

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/ItoZKK10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/ItoZKK10
Takashi Ito, Xiaoli Zhu, Shin-Ichiro Kuroki, Koji Kotani:
Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels. IEICE Trans. Electron. 93-C(11): 1638-1644 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.