"Application of Partially Rotational Scan Technique with Tester IP for ..."

Kenichi Ichino et al. (2004)

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type: Journal Article

metadata version: 2020-04-11

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Kenichi Ichino, Ko-ichi Watanabe, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki:
Application of Partially Rotational Scan Technique with Tester IP for Processor Circuits. IEICE Trans. Inf. Syst. 87-D(3): 586-591 (2004)

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