"Characterization of Vertical Alignment Film by X-Ray Reflectivity."

Ichiro Hirosawa, Tomoyuki Koganezawa, Hidenori Ishii (2011)

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DOI: 10.1587/TRANSELE.E94.C.1755

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/HirosawaKI11
Ichiro Hirosawa, Tomoyuki Koganezawa, Hidenori Ishii:
Characterization of Vertical Alignment Film by X-Ray Reflectivity. IEICE Trans. Electron. 94-C(11): 1755-1759 (2011)

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