"Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors."

Yoshinobu Higami et al. (2008)

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DOI: 10.1093/IETFEC/E91-A.12.3506

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type: Journal Article

metadata version: 2020-04-11

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Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu:
Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 91-A(12): 3506-3513 (2008)

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