"Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG ..."

Yoshinobu Higami et al. (2012)

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DOI: 10.1587/TRANSINF.E95.D.1093

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/HigamiOYTSA12
Yoshinobu Higami, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo:
Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool. IEICE Trans. Inf. Syst. 95-D(4): 1093-1100 (2012)

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