"Experimental Evaluation of Dynamic Power Supply Noise and Logical Failures ..."

Mitsuya Fukazawa et al. (2009)

> Home

Details and statistics

DOI: 10.1587/TRANSELE.E92.C.475

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/FukazawaKATN09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/FukazawaKATN09
Mitsuya Fukazawa, Masanori Kurimoto, Rei Akiyama, Hidehiro Takata, Makoto Nagata:
Experimental Evaluation of Dynamic Power Supply Noise and Logical Failures in Microprocessor Operations. IEICE Trans. Electron. 92-C(4): 475-482 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.