"A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior."

Raúl Fernández-García et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.1906

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/Fernandez-GarciaGBBV11
Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon:
A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. IEICE Trans. Electron. 94-C(12): 1906-1908 (2011)

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