![](https://dblp.uni-trier.de./img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de./img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de./img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
default search action
"Suppression of Current Collapse of High-Voltage AlGaN/GaN HFETs on Si ..."
Tadayoshi Deguchi et al. (2012)
- Tadayoshi Deguchi, Hideshi Tomita, Atsushi Kamada, Manabu Arai, Kimiyoshi Yamasaki, Takashi Egawa:
Suppression of Current Collapse of High-Voltage AlGaN/GaN HFETs on Si Substrates by Utilizing a Graded Field-Plate Structure. IEICE Trans. Electron. 95-C(8): 1343-1347 (2012)
![](https://dblp.uni-trier.de./img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.