"Analyses on Current Characteristics of 3-D MOSFET Determined by Junction ..."

Seongjae Cho et al. (2007)

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DOI: 10.1093/IETELE/E90-C.5.988

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type: Journal Article

metadata version: 2020-04-11

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Seongjae Cho, Jang-Gn Yun, Il-Han Park, Jung Hoon Lee, Jong Pil Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park:
Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices. IEICE Trans. Electron. 90-C(5): 988-993 (2007)

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