"Errors in Pi-Coefficients Due to the Strain Effects in Resistor Stress ..."

Chun-Hyung Cho, Ho-Young Cha (2011)

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DOI: 10.1587/TRANSELE.E94.C.791

access: closed

type: Journal Article

metadata version: 2020-04-11

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Chun-Hyung Cho, Ho-Young Cha:
Errors in Pi-Coefficients Due to the Strain Effects in Resistor Stress Sensor on (001) Silicon. IEICE Trans. Electron. 94-C(5): 791-795 (2011)

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