"Study on Test Data Reduction Combining Illinois Scan and Bit Flipping."

Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (2008)

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DOI: 10.1093/IETISY/E91-D.3.720

access: closed

type: Journal Article

metadata version: 2020-04-11

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Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki:
Study on Test Data Reduction Combining Illinois Scan and Bit Flipping. IEICE Trans. Inf. Syst. 91-D(3): 720-725 (2008)

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