"High Moisture Resistant and Reliable Gate Structure Design in High Power ..."

Hirotaka Amasuga et al. (2008)

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DOI: 10.1093/IETELE/E91-C.5.676

access: closed

type: Journal Article

metadata version: 2020-04-11

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Hirotaka Amasuga, Toshihiko Shiga, Masahiro Totsuka, Seiki Goto, Akira Inoue:
High Moisture Resistant and Reliable Gate Structure Design in High Power pHEMTs for Millimeter-Wave Applications. IEICE Trans. Electron. 91-C(5): 676-682 (2008)

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