"Substrate effect on radiation-induced charge trapping in buried oxide for ..."

Huilong Zhu et al. (2020)

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DOI: 10.1587/ELEX.17.20200001

access: open

type: Journal Article

metadata version: 2021-02-12

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  - journals/ieiceee/ZhuBXHZZ20
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  - https://dblp.org/rec/journals/ieiceee/ZhuBXHZZ20
Huilong Zhu, Dawei Bi, Xin Xie, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou:
Substrate effect on radiation-induced charge trapping in buried oxide for partially-depleted SOI NMOSFET. IEICE Electron. Express 17(7): 20200001 (2020)

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