"Multi-transition delay test for improving the coverage of cell internal ..."

Hong Zhang et al. (2024)

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DOI: 10.1587/ELEX.21.20240326

access: open

type: Journal Article

metadata version: 2024-11-27

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Hong Zhang, Huaguo Liang, Yue Wang, Danqing Li, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang:
Multi-transition delay test for improving the coverage of cell internal defects. IEICE Electron. Express 21(15): 20240326 (2024)

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