"A DMR logic for mitigating the SET induced soft errors in combinational ..."

Jiajin Zhang et al. (2016)

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DOI: 10.1587/ELEX.12.20150927

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/ZhangHDQLYC16
Jiajin Zhang, Yang Housen, Yankang Du, Gao Quan, Peng Lin, Zhang Yue, Lichang Chen:
A DMR logic for mitigating the SET induced soft errors in combinational circuits. IEICE Electron. Express 13(2): 20150927 (2016)

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