"Power, performance, and area evaluation across 180nm-28nm technology nodes ..."

Minghui Yin et al. (2024)

> Home

Details and statistics

DOI: 10.1587/ELEX.21.20240194

access: open

type: Journal Article

metadata version: 2024-05-18

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ieiceee/YinLZLZYW24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/YinLZLZYW24
Minghui Yin, Zhiqiang Li, Weihua Zhang, Hongwei Liu, Huanhuan Zhou, Yunxia You, Chen Wang:
Power, performance, and area evaluation across 180nm-28nm technology nodes based on benchmark circuits. IEICE Electron. Express 21: 20240194 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.