"Extracting random jitter and sinusoidal jitter in ADC output with a single ..."

Minshun Wu, Zhiqiang Liu, Degang Chen (2015)

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DOI: 10.1587/ELEX.12.20150742

access: open

type: Journal Article

metadata version: 2022-07-26

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Minshun Wu, Zhiqiang Liu, Degang Chen:
Extracting random jitter and sinusoidal jitter in ADC output with a single frequency test. IEICE Electron. Express 12(20): 20150742 (2015)

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