"A high-sensitive digital photosensor using MOS interface-trap charge pumping."

Akihiro Uehara et al. (2004)

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DOI: 10.1587/ELEX.1.556

access: open

type: Journal Article

metadata version: 2022-08-16

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  - https://dblp.org/rec/journals/ieiceee/UeharaKTON04
Akihiro Uehara, Keiichiro Kagawa, Takashi Tokuda, Jun Ohta, Masahiro Nunoshita:
A high-sensitive digital photosensor using MOS interface-trap charge pumping. IEICE Electron. Express 1(18): 556-561 (2004)

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