"Measurement of SET pulse width modulation in CMOS combinational logic by ..."

Yuta Tsuchiya, Toru Nakura (2024)

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DOI: 10.1587/ELEX.21.20240518

access: open

type: Journal Article

metadata version: 2024-11-30

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Yuta Tsuchiya, Toru Nakura:
Measurement of SET pulse width modulation in CMOS combinational logic by laser-induced fault injection. IEICE Electron. Express 21(21): 20240518 (2024)

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