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"Nondestructive measurement of layer structures in dielectric substrates by ..."
Yuya Tojima et al. (2018)
- Yuya Tojima, Hiroki Sudo, Takayuki Kubota, Keizo Cho, Hiroaki Nakabayashi, Koji Suizu:
Nondestructive measurement of layer structures in dielectric substrates by collimated terahertz time domain spectroscopy. IEICE Electron. Express 15(15): 20180579 (2018)
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