"Reduced-code test method using sub-histograms for pipelined ADCs."

HyeonUk Son et al. (2015)

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DOI: 10.1587/ELEX.12.20150417

access: open

type: Journal Article

metadata version: 2024-07-15

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  - https://dblp.org/rec/journals/ieiceee/SonJKK15
HyeonUk Son, Jaewon Jang, Heetae Kim, Sungho Kang:
Reduced-code test method using sub-histograms for pipelined ADCs. IEICE Electron. Express 12(12): 20150417 (2015)

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