"High-resolution and all-digital on-chip delay measurement with low supply ..."

Duo Sheng et al. (2014)

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DOI: 10.1587/ELEX.11.20131011

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/ShengCLJ14
Duo Sheng, Ching-Che Chung, Hsiu-Fan Lai, Shu-Syun Jhao:
High-resolution and all-digital on-chip delay measurement with low supply sensitivity for SoC applications. IEICE Electron. Express 11(3): 20131011 (2014)

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