"Using simulated annealing to generate input pairs to measure the maximum ..."

Alberto Palacios Pawlovsky (2005)

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DOI: 10.1587/ELEX.2.115

access: open

type: Journal Article

metadata version: 2021-02-12

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Alberto Palacios Pawlovsky:
Using simulated annealing to generate input pairs to measure the maximum power dissipation in combinational CMOS circuits. IEICE Electron. Express 2(4): 115-120 (2005)

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