"A comprehensive metering scheme for intellectual property protection ..."

Aobo Pan et al. (2013)

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DOI: 10.1587/ELEX.10.20130649

access: open

type: Journal Article

metadata version: 2024-05-07

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Aobo Pan, Yaping Lin, Wenjie Che, Zhiqiang You, Yonghe Liu, Jinguo Li:
A comprehensive metering scheme for intellectual property protection during both after-sale and evaluation periods of IC design. IEICE Electron. Express 10(19): 20130649 (2013)

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