"Study of charge retention mechanism for DNA memory FET."

Shoko Maeno et al. (2014)

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DOI: 10.1587/ELEX.11.20130900

access: open

type: Journal Article

metadata version: 2024-10-06

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  - https://dblp.org/rec/journals/ieiceee/MaenoMNHTYFY14
Shoko Maeno, Naoto Matsuo, Shohei Nakamura, Akira Heya, Tadao Takada, Kazushige Yamana, Masataka Fukuyama, Shin Yokoyama:
Study of charge retention mechanism for DNA memory FET. IEICE Electron. Express 11(5): 20130900 (2014)

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