"A method for the fast diagnosis of multiple defects using an efficient ..."

Yoseop Lim, Jaeseok Park, Sungho Kang (2012)

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DOI: 10.1587/ELEX.9.834

access: open

type: Journal Article

metadata version: 2024-07-15

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Yoseop Lim, Jaeseok Park, Sungho Kang:
A method for the fast diagnosis of multiple defects using an efficient candidate selection algorithm. IEICE Electron. Express 9(9): 834-839 (2012)

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