"A novel high performance 3×VDD-tolerant ESD detection circuit in ..."

Xiaoyun Li et al. (2017)

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DOI: 10.1587/ELEX.14.20170899

access: open

type: Journal Article

metadata version: 2022-12-15

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  - https://dblp.org/rec/journals/ieiceee/LiCLWLMS17
Xiaoyun Li, Houpeng Chen, Yu Lei, Qian Wang, Xi Li, Jie Miao, Zhitang Song:
A novel high performance 3×VDD-tolerant ESD detection circuit in advanced CMOS process. IEICE Electron. Express 14(21): 20170899 (2017)

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