"A low cost test pattern generator for test-per-clock BIST scheme."

Shaochong Lei et al. (2010)

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DOI: 10.1587/ELEX.7.672

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/LeiWLL10
Shaochong Lei, Zhen Wang, Zeye Liu, Feng Liang:
A low cost test pattern generator for test-per-clock BIST scheme. IEICE Electron. Express 7(10): 672-677 (2010)

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