"Temperature and voltage droop-aware test scheduling during scan shift ..."

Taehee Lee, YongJoon Kim, Joon-Sung Yang (2016)

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DOI: 10.1587/ELEX.13.20160581

access: open

type: Journal Article

metadata version: 2021-02-12

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Taehee Lee, YongJoon Kim, Joon-Sung Yang:
Temperature and voltage droop-aware test scheduling during scan shift operation. IEICE Electron. Express 13(18): 20160581 (2016)

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