"An approximated soft error analysis technique for gate-level designs."

Soongyu Kwon, Jong Kang Park, Jong Tae Kim (2014)

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DOI: 10.1587/ELEX.11.20140224

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/KwonPK14
Soongyu Kwon, Jong Kang Park, Jong Tae Kim:
An approximated soft error analysis technique for gate-level designs. IEICE Electron. Express 11(10): 20140224 (2014)

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