"Total ionizing dose radiation effect on the threshold voltage for the ..."

Minru Hao et al. (2017)

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DOI: 10.1587/ELEX.14.20170411

access: open

type: Journal Article

metadata version: 2021-02-12

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  - journals/ieiceee/HaoHLKSZZ17
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  - https://dblp.org/rec/journals/ieiceee/HaoHLKSZZ17
Minru Hao, Huiyong Hu, Chen-Guang Liao, Haiyan Kang, Han Su, Qian Zhang, Yingbo Zhao:
Total ionizing dose radiation effect on the threshold voltage for the uniaxial strained Si nano NMOSFET. IEICE Electron. Express 14(11): 20170411 (2017)

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