"An experimental study on dynamic junction temperature estimation of SiC ..."

Shuhei Fukunaga et al. (2019)

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DOI: 10.1587/ELEX.16.20190392

access: open

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/ieiceee/FukunagaFHK19
Shuhei Fukunaga, Tsuyoshi Funaki, Shinsuke Harada, Yusuke Kobayashi:
An experimental study on dynamic junction temperature estimation of SiC MOSFET with built-in SBD. IEICE Electron. Express 16(17): 20190392 (2019)

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