"10-year reliability test results for SC connector installed on outside plant."

Yoshiteru Abe et al. (2009)

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DOI: 10.1587/ELEX.6.472

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/AbeYAN09
Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase:
10-year reliability test results for SC connector installed on outside plant. IEICE Electron. Express 6(8): 472-476 (2009)

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