"NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors."

Jan Peter van Zandwijk, Aya Fukami (2017)

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DOI: 10.1109/MSP.2017.4251114

access: closed

type: Journal Article

metadata version: 2020-03-15

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  - https://dblp.org/rec/journals/ieeesp/ZandwijkF17
Jan Peter van Zandwijk, Aya Fukami:
NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors. IEEE Secur. Priv. 15(6): 82-87 (2017)

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