"An application of machine learning and statistics to defect detection."

Rita Cucchiara et al. (2001)

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DOI: —

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type: Journal Article

metadata version: 2015-05-18

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Rita Cucchiara, Paola Mello, Massimo Piccardi, Fabrizio Riguzzi:
An application of machine learning and statistics to defect detection. Intell. Data Anal. 5(2): 151-164 (2001)

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