"Product-representative 'at speed' test structures for CMOS characterization."

Mark B. Ketchen, Manjul Bhushan (2006)

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DOI: 10.1147/RD.504.0451

access: closed

type: Journal Article

metadata version: 2020-03-13

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Mark B. Ketchen, Manjul Bhushan:
Product-representative 'at speed' test structures for CMOS characterization. IBM J. Res. Dev. 50(4-5): 451-468 (2006)

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