"Scanning tunneling microscopy of cleaved semiconductor surfaces."

Randall M. Feenstra, A. P. Fein (1986)

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DOI: 10.1147/RD.305.0466

access: closed

type: Journal Article

metadata version: 2020-05-12

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Randall M. Feenstra, A. P. Fein:
Scanning tunneling microscopy of cleaved semiconductor surfaces. IBM J. Res. Dev. 30(5): 466-471 (1986)

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