"Model for Transient and Permanent Error-Detection and Fault-Isolation ..."

Douglas C. Bossen, M. Y. (Ben) Hsiao (1982)

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DOI: 10.1147/RD.261.0067

access: closed

type: Journal Article

metadata version: 2020-03-13

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Douglas C. Bossen, M. Y. (Ben) Hsiao:
Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage. IBM J. Res. Dev. 26(1): 67-77 (1982)

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