"Transient Analysis and Device Characterization of ACP Circuits."

Kanu G. Ashar et al. (1963)

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DOI: 10.1147/RD.73.0207

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/ibmrd/AsharGAP63
Kanu G. Ashar, Hitendra Nath Ghosh, Arthur W. Aldridge, Lawrence J. Patterson:
Transient Analysis and Device Characterization of ACP Circuits. IBM J. Res. Dev. 7(3): 207-223 (1963)

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