"Analysis of the soft error susceptibility and failure rate in logic circuits."

Eman AlQuraishi, May Al-Roomi, Sobeeh Almukhaizim (2011)

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type: Journal Article

metadata version: 2023-03-16

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Eman AlQuraishi, May Al-Roomi, Sobeeh Almukhaizim:
Analysis of the soft error susceptibility and failure rate in logic circuits. Int. Arab J. Inf. Technol. 8(4): 388-396 (2011)

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