"A mask guided cross data augmentation method for industrial defect detection."

Xubin Wang, Wenju Li, Chang Lu (2025)

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DOI: 10.1016/J.FUTURE.2024.107676

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type: Journal Article

metadata version: 2025-01-25

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Xubin Wang, Wenju Li, Chang Lu:
A mask guided cross data augmentation method for industrial defect detection. Future Gener. Comput. Syst. 166: 107676 (2025)

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