"Seal imprint verification via feature analysis and classifications."

Wei-Ho Chung et al. (2019)

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DOI: 10.1016/J.FUTURE.2019.04.027

access: closed

type: Journal Article

metadata version: 2020-02-19

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Wei-Ho Chung, Mu-En Wu, Yeong-Luh Ueng, Yu-Hsuan Su:
Seal imprint verification via feature analysis and classifications. Future Gener. Comput. Syst. 101: 458-466 (2019)

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