"IPSETFUL: an iterative process of selecting test cases for effective fault ..."

Xiaobing Sun et al. (2016)

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DOI: 10.1007/S11704-016-5226-Y

access: closed

type: Journal Article

metadata version: 2021-12-14

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Xiaobing Sun, Xin Peng, Bin Li, Bixin Li, Wanzhi Wen:
IPSETFUL: an iterative process of selecting test cases for effective fault localization by exploring concept lattice of program spectra. Frontiers Comput. Sci. 10(5): 812-831 (2016)

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