"Deep metric learning with in-batch feature vector constraints and ..."

Wonjik Kim (2025)

> Home

Details and statistics

DOI: 10.1007/S12065-024-00990-Z

access: closed

type: Journal Article

metadata version: 2024-12-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/evi/Kim25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/evi/Kim25
Wonjik Kim:
Deep metric learning with in-batch feature vector constraints and unsupervised label integration. Evol. Intell. 18(1): 5 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.