"Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test ..."

Ying Zhang et al. (2018)

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DOI: 10.1007/S10836-018-5733-X

access: closed

type: Journal Article

metadata version: 2023-03-09

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Ying Zhang, Li Ling, Jianhui Jiang, Jie Xiao:
Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. J. Electron. Test. 34(4): 447-460 (2018)

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