"ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions."

Jun Yuan et al. (2024)

> Home

Details and statistics

DOI: 10.1007/S10836-024-06127-5

access: closed

type: Journal Article

metadata version: 2024-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/YuanZZHH24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/YuanZZHH24
Jun Yuan, Yuyang Zhang, Liangrui Zhang, Shuaiqi Hou, Yukun Han:
ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions. J. Electron. Test. 40(4): 457-468 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.