"LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan ..."

Haiying Yuan et al. (2018)

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DOI: 10.1007/S10836-018-5756-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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Haiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang:
LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs. J. Electron. Test. 34(6): 685-695 (2018)

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